题名 | Noise sensitivity to gamma radiation in Si-jfet devices | 作者 | J. Assaf | 杂志 | Radiation Effects and Defects in Solids | 年|卷|期 | Volume 157, Issue 4, 2002 | 页码 | 401-410 | 链接 | http://www.tandfonline.com/doi/abs/10.1080/10420150214034#.VcCccmaqqko |
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