题名 | Degradation in AlGaN/GaN heterojunction field effect transistors upon electrical stress: Effects of field and temperature | 链接 | http://scitation.aip.org/content/aip/journal/apl/103/16/10.1063/1.4826324 |
Degradation in AlGaN/GaN heterojunction field effect transistors upon electrical stress: Effects of field and temperature
http://scitation.aip.org/content ... 6/10.1063/1.4826324
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