题名 | Evaluation of Radiation Sensor Aspects of text{Er}_2 text{O}_3 MOS Capacitors under Zero Gate Bias | 作者 | Aysegul Kahraman ; Abant Izzet Baysal University, Bolu, Turkey ; Ercan Yilmaz ; Aliekber Aktag ; Senol Kaya | 杂志 | IEEE Transactions on Nuclear Science, | 年|卷|期 | Vol.63,No.2 | 页码 | 1284 - 1293 | 链接 | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7454848&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D7454848 |
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