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标题: Study on Oxide Thickness Dependence of Current-Voltage Characteristics for Hf... [打印本页]

作者: tookey0116 时间: 2015-7-26 10:03
标题: Study on Oxide Thickness Dependence of Current-Voltage Characteristics for Hf...

题名	Study on Oxide Thickness Dependence of Current-Voltage Characteristics for HfOx Based ReRAM Device
链接	http://ecst.ecsdl.org/content/64/14/93

作者: なつめたかし 时间: 2015-7-26 10:03
http://1000eb.com/1ezuw

作者: なつめたかし 时间: 2015-7-26 10:06
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