题名 | Tri-Resistive Switching Behavior of Hydrogen Induced Resistance Random Access Memory |
作者 | Tian-Jian Chu ; Dept. of Mater. & Optoelectron. Sci., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan ; Tsung-Ming Tsai ; Ting-Chang Chang ; Kuan-Chang Chang more authors |
杂志 | Electron Device Letters, IEEE .. |
年|卷|期 | Electron Device Letters, IEEE (Volume:35 , Issue: 2 ) |
页码 | 217 - 219 |
链接 | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6701322&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D6701322 |
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