科研速递论坛

标题: Modeling Defect Enhanced Detection at 1550 nm in Integrated Silicon Waveguide... [打印本页]

作者: In-June 时间: 2014-8-19 18:01
标题: Modeling Defect Enhanced Detection at 1550 nm in Integrated Silicon Waveguide...
Modeling Defect Enhanced Detection at 1550 nm in Integrated Silicon Waveguide Photodetectors

作者: newgram 时间: 2014-8-19 18:09
谢谢大神

欢迎光临科研速递论坛 (http://expaper.cn/)