题名 | A Markov random field model-based approach to image interpretation |
作者 | Modestino, J.W. ; Dept. of Electr. Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, New York, NY, USA ; Zhang, J. |
链接 | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=37888&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D37888 |
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