题名 | Image quality assessment scheme with topographic independent components analysis for sparse feature extraction |
作者 | Yong Ding ; Inst. of VLSI Design, Zhejiang Univ., Hangzhou, China ; Hang Dai ; Shaoze Wang |
链接 | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6780227&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel7%2F2220%2F6780208%2F06780227.pdf%3Farnumber%3D6780227 |
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