题名 | High Resolution In Situ TEM Studies of Silicide-Mediated Crystallization of Amorphous Silicon |
作者 | C. Hayzelden and J. L. Batstone |
杂志 | MRS Proceedings |
年|卷|期 | Volume 321 / 1993 |
页码 | 579 |
链接 | http://journals.cambridge.org/action/displayAbstract;jsessionid=7C5EC83430E7076B447622B0FC535662.journals?fromPage=online&aid=8091120 |
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