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标题: Secondary ion mass spectrometry analysis of ultrathin impurity layers in semi... [打印本页]

作者: Anthea14 时间: 2013-9-26 00:01
标题: Secondary ion mass spectrometry analysis of ultrathin impurity layers in semi...

题名	Secondary ion mass spectrometry analysis of ultrathin impurity layers in semiconductors and their use in quantification, instrumental assessment, and fundamental measurements
作者	M. G. Dowsett, R. D. Barlow, and P. N. Allen
杂志	J. Vac. Sci. Technol. B
年\|卷\|期	1994, 12
页码	186
链接	http://avspublications.org/jvstb/resource/1/jvtbd9/v12/i1/p186_s1?isAuthorized=no

作者: liuzff 时间: 2013-9-26 00:01
http://pan.baidu.com/s/100uvm

作者: liuzff 时间: 2013-9-26 00:04
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作者: ak47 时间: 2013-9-26 00:05
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