题名 | Simulation of Single Particle Displacement Damage in Silicon – Part I: Global Approach and Primary Interaction Simulation |
作者 | Mélanie Raine ; Antoine Jay ; Nicolas Richard ; Vincent Goiffon ; Sylvain Girard ; Marc Gaillardin ; |
杂志 | IEEE Transactions on Nuclear Science |
年|卷|期 | Volume: 64, Issue: 1, Jan. 2017 |
页码 | 133-140 |
链接 | http://ieeexplore.ieee.org/abstract/document/7582531/ |
本帖最后由 nucleus 于 2017-3-24 17:37 编辑
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