题名 | Electrical nanocharacterization of copper tetracyanoquinodimethane layers dedicated to resistive random access memories |
链接 | http://scitation.aip.org/content/aip/journal/apl/96/26/10.1063/1.3458596 |
本帖最后由 lo7ve77 于 2016-11-2 16:49 编辑
欢迎光临 科研速递论坛 (http://expaper.cn/) | Powered by Discuz! X2.5 |