题名 | Resistive switching characteristics and mechanisms in silicon oxide memory devices |
链接 | http://xueshu.baidu.com/s?wd=paperuri%3A%28040d8d3f4dd88e0ab1ddc63332b5853d%29&filter=sc_long_sign&tn=SE_xueshusource_2kduw22v&sc_vurl=http%3A%2F%2Fdx.doi.org%2F10.1515%2Fpsr-2016-0011&ie=utf-8&sc_us=3353557219207901181 |
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