题名 | Evaluation of Radiation Sensor Aspects of text{Er}_2 text{O}_3 MOS Capacitors under Zero Gate Bias |
作者 | Aysegul Kahraman ; Abant Izzet Baysal University, Bolu, Turkey ; Ercan Yilmaz ; Aliekber Aktag ; Senol Kaya |
杂志 | IEEE Transactions on Nuclear Science, |
年|卷|期 | Vol.63,No.2 |
页码 | 1284 - 1293 |
链接 | http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7454848&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D7454848 |
本帖最后由 lo7ve77 于 2016-8-22 22:24 编辑
欢迎光临 科研速递论坛 (http://expaper.cn/) | Powered by Discuz! X2.5 |