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标题: Reliability/Uniformity improvement induced by an ultrathin TiO2 insertion in ... [打印本页]

作者: tookey0116 时间: 2016-8-8 14:10
标题: Reliability/Uniformity improvement induced by an ultrathin TiO2 insertion in ...

题名	Reliability/Uniformity improvement induced by an ultrathin TiO2 insertion in Ti/HfO2/Pt resistive switching memories
链接	http://xueshu.baidu.com/s?wd=paperuri%3A%284a88085495986e9a5f070eca0492e615%29&filter=sc_long_sign&tn=SE_xueshusource_2kduw22v&sc_vurl=http%3A%2F%2Fwww.sciencedirect.com%2Fscience%2Farticle%2Fpii%2FS002627141630110X&ie=utf-8&sc_us=17266384971609790648

作者: pnas2009 时间: 2016-8-8 14:10
http://disk.680.com/emaYZj

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