题名 | Microscopic origin of read current noise in TaOx-based resistive switching memory by ultra-low temperature measurement |
链接 | http://scitation.aip.org/content/aip/journal/apl/108/15/10.1063/1.4945790 |
本帖最后由 tookey0116 于 2016-5-23 08:30 编辑
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