题名 | Evidence of interface conversion and electrical characteristics improvement of ultra-thin HfTiO films upon rapid thermal annealing |
链接 | http://scitation.aip.org/content/aip/journal/apl/99/18/10.1063/1.3658396 |
欢迎光临 科研速递论坛 (http://expaper.cn/) | Powered by Discuz! X2.5 |